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术语 level-sensitive scan design (LSSD)
释义 level-sensitive scan design (LSSD)
电平相关扫描设计法
A logic design method adopted for the purpose of improving the testability of logic circuit,especially, LSI circuit. With this method, the steady state response of the system is dependent upon the final level of input only, and is independent of the sequence of inputvariations. The test of complex sequential circuit is basically converted to the test of combinatorial circuit by this method.
为了提高逻辑电路特别是大规模集成电路的可测 试性而采用的一种逻辑设计方法,在这种方法中,系统的稳态响应与输入变化的次序无关,而 仅取决于输入变化的最终稳态电平值。这种方法将复杂的时序电路测试基本上 简化成组合电路测试。
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