术语 | computer-operated memory test system |
释义 | computer-operated memory test system 计算机控制存储器测试系统 Computer-operated test systems designed to test semiconductor memories. They combine the reliability and productivity necessary for production testing with the versatility required for device characterization and evaluation. 在计算机的控制下对半导体存储器进行测试的系统,既能满足产品测试的可靠性与生产率,又有 适应器件特性、设备更新演变的灵活性。 |
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